Michal Kowalski

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Santa Cruz, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Computer-implemented methods and systems for classifying defects on...
- Patent number 8,532,949
- Issue date Sep 10, 2013
- KLA-Tencor Technologies Corp.
- Cho Huak Teh
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 8,111,900
- Issue date Feb 7, 2012
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating information to be used for selec...
- Patent number 8,000,922
- Issue date Aug 16, 2011
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 7,729,529
- Issue date Jun 1, 2010
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-IMPLEMENTED METHODS FOR DETECTING AND/OR SORTING DEFECTS I...
- Publication number 20100226562
- Publication date Sep 9, 2010
- KLA-Tencor Technologies Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...
- Publication number 20090299681
- Publication date Dec 3, 2009
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
Computer-implemented methods for detecting and/or sorting defects i...
- Publication number 20060291714
- Publication date Dec 28, 2006
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods and systems for classifying defects on...
- Publication number 20060082763
- Publication date Apr 20, 2006
- Cho Huak Teh
- G06 - COMPUTING CALCULATING COUNTING