Michal Olsak

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Sokolnice, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Instability management in a signal driver circuit
- Patent number 11,716,079
- Issue date Aug 1, 2023
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Michal Olsak
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inductive position sensor with integrated fault detection
- Patent number 11,536,588
- Issue date Dec 27, 2022
- Semiconductor Components Industries, LLC
- Pavel Baros
- G01 - MEASURING TESTING
Information Patent Grant
Instability management in a signal driver circuit
- Patent number 11,251,789
- Issue date Feb 15, 2022
- Semiconductor Components Industries, LLC
- Michal Olsak
- G05 - CONTROLLING REGULATING
Information Patent Grant
Open circuit detection for inductive sensors
- Patent number 9,625,279
- Issue date Apr 18, 2017
- Semiconductor Components Industries, LLC
- Michal Olsak
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of forming same for temperature com...
- Patent number 8,446,209
- Issue date May 21, 2013
- Semiconductor Components Industries, LLC
- Pavel Horsky
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
INSTABILITY MANAGEMENT IN A SIGNAL DRIVER CIRCUIT
- Publication number 20220123742
- Publication date Apr 21, 2022
- Semiconductor Components Industries, LLC
- Michal OLSAK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INSTABILITY MANAGEMENT IN A SIGNAL DRIVER CIRCUIT
- Publication number 20220029616
- Publication date Jan 27, 2022
- Semiconductor Components Industries, LLC
- Michal OLSAK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INDUCTIVE POSITION SENSOR WITH INTEGRATED FAULT DETECTION
- Publication number 20220026244
- Publication date Jan 27, 2022
- Semiconductor Components Industries, LLC
- Pavel BAROS
- G01 - MEASURING TESTING
Information Patent Application
OPEN CIRCUIT DETECTION FOR INDUCTIVE SENSORS
- Publication number 20160273945
- Publication date Sep 22, 2016
- Semiconductor Components Industries, LLC
- Michal OLSAK
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME FOR TEMPERATURE COM...
- Publication number 20130135032
- Publication date May 30, 2013
- Pavel Horsky
- H03 - BASIC ELECTRONIC CIRCUITRY