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Michal Postolski
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Barlinek, PL
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last 30 patents
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Patent Grant
Method for positioning objects in a particle beam microscope with t...
Patent number
12,300,459
Issue date
May 13, 2025
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for analyzing and/or processing an object as well as a parti...
Patent number
9,558,911
Issue date
Jan 31, 2017
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
METHOD FOR POSITIONING OBJECTS IN A PARTICLE BEAM MICROSCOPE WITH T...
Publication number
20220375714
Publication date
Nov 24, 2022
CARL ZEISS MICROSCOPY GMBH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CONTROLLING A UNIT OF A PARTICLE BEAM DEVICE AND PARTICL...
Publication number
20200333271
Publication date
Oct 22, 2020
CARL ZEISS MICROSCOPY GMBH
Christian Hendrich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR ANALYZING AND/OR PROCESSING AN OBJECT AS WELL AS A PARTI...
Publication number
20160035534
Publication date
Feb 4, 2016
CARL ZEISS MICROSCOPY GMBH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS