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Michal V. Wolkin

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  • Los Altos, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Layered structures on thin substrates
    • Patent number 10,046,584
    • Issue date Aug 14, 2018
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for producing layered structures on thin substrates
    • Patent number 9,528,888
    • Issue date Dec 27, 2016
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Layered structures on thin substrates
    • Patent number 8,637,138
    • Issue date Jan 28, 2014
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
  • Information Patent Grant

    Nanocalorimeter based on thermal probes
    • Patent number 8,393,785
    • Issue date Mar 12, 2013
    • Palo Alto Research Center Incorporated
    • Dirk De Bruyker
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Vanadium oxide thermal microprobes
    • Patent number 8,130,072
    • Issue date Mar 6, 2012
    • Palo Alto Research Center Incorporated
    • Dirk De Bruyker
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal sensing with bridge circuitry
    • Patent number 7,833,800
    • Issue date Nov 16, 2010
    • Palo Alto Research Center Incorporated
    • Alan Bell
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Passive electronic devices
    • Patent number 7,816,146
    • Issue date Oct 19, 2010
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Producing layered structures using printing
    • Patent number 7,784,173
    • Issue date Aug 31, 2010
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal sensing
    • Patent number 7,473,030
    • Issue date Jan 6, 2009
    • Palo Alto Research Center Incorporated
    • Richard H. Bruce
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Resistive thermal sensing
    • Patent number 7,473,031
    • Issue date Jan 6, 2009
    • Palo Alto Research Center, Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    LAYERED STRUCTURES ON THIN SUBSTRATES
    • Publication number 20170097266
    • Publication date Apr 6, 2017
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Application

    Layered Structures on Thin Substrates
    • Publication number 20130016756
    • Publication date Jan 17, 2013
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
  • Information Patent Application

    VANADIUM OXIDE THERMAL MICROPROBES
    • Publication number 20100289613
    • Publication date Nov 18, 2010
    • Palo Alto Research Center Incorporated
    • Dirk De Bruyker
    • G01 - MEASURING TESTING
  • Information Patent Application

    NANOCALORIMETER BASED ON THERMAL PROBES
    • Publication number 20100290501
    • Publication date Nov 18, 2010
    • Palo Alto Research Center Incorporated
    • Dirk De Bruyker
    • G01 - MEASURING TESTING
  • Information Patent Application

    Layered structures on thin substrates
    • Publication number 20070148416
    • Publication date Jun 28, 2007
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Application

    Passive electronic devices
    • Publication number 20070145362
    • Publication date Jun 28, 2007
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Application

    Producing layered structures using printing
    • Publication number 20070147473
    • Publication date Jun 28, 2007
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING
  • Information Patent Application

    Thermal sensing with bridge circuitry
    • Publication number 20050254994
    • Publication date Nov 17, 2005
    • Palo Alto Research Center Incorporated
    • Alan Bell
    • G01 - MEASURING TESTING
  • Information Patent Application

    Thermal sensing
    • Publication number 20050254552
    • Publication date Nov 17, 2005
    • Palo Alto Research Center Incorporated
    • Richard H. Bruce
    • G01 - MEASURING TESTING
  • Information Patent Application

    Resistive thermal sensing
    • Publication number 20050238080
    • Publication date Oct 27, 2005
    • Palo Alto Research Center Incorporated
    • Michal V. Wolkin
    • G01 - MEASURING TESTING