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Michal YACHINI
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Rehovot, IL
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Patents Grants
last 30 patents
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Patent Grant
Method and system for optical characterization of patterned samples
Patent number
11,885,737
Issue date
Jan 30, 2024
Nova Ltd.
Dror Shafir
G01 - MEASURING TESTING
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Patent Grant
Method and system for optical characterization of patterned samples
Patent number
10,876,959
Issue date
Dec 29, 2020
Nova Measuring Instruments Ltd.
Dror Shafir
G01 - MEASURING TESTING
Information
Patent Grant
Overlay design optimization
Patent number
10,311,198
Issue date
Jun 4, 2019
Nova Measuring Instruments Ltd.
Gilad Barak
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT
Publication number
20240068964
Publication date
Feb 29, 2024
NOVA LTD
Shahar Gov
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
Publication number
20210116359
Publication date
Apr 22, 2021
NOVA MEASURING INSTRUMENTS LTD.
Dror SHAFIR
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
Publication number
20180328837
Publication date
Nov 15, 2018
NOVA MEASURING INSTRUMENTS LTD.
Dror SHAFIR
G01 - MEASURING TESTING
Information
Patent Application
OVERLAY DESIGN OPTIMIZATION
Publication number
20170061066
Publication date
Mar 2, 2017
NOVA MEASURING INSTRUMENTS LTD.
Gilad BARAK
G06 - COMPUTING CALCULATING COUNTING