Michel Aliman

Person

Oberkochen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with ring-shaped ion storage cell and mass spectrometer
- Patent number 11,935,734
- Issue date Mar 19, 2024
- LEYBOLD GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing a gas by mass spectrometry, and mass spectrometer
- Patent number 11,107,670
- Issue date Aug 31, 2021
- LEYBOLD GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for mass spectrometric examination of gas mixtures and mass...
- Patent number 10,903,060
- Issue date Jan 26, 2021
- LEYBOLD GMBH
- Hin Yiu Anthony Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, use thereof, and method for the mass spectrometr...
- Patent number 10,304,672
- Issue date May 28, 2019
- Carl Zeiss SMT GmbH
- Gennady Fedosenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device with mass spectrometer therewith
- Patent number 10,236,169
- Issue date Mar 19, 2019
- Carl Zeiss SMT GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for examining a gas by mass spectrometry and mass spectrometer
- Patent number 10,141,174
- Issue date Nov 27, 2018
- Carl Zeiss SMT GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus and method for operating a particle beam ap...
- Patent number 9,947,504
- Issue date Apr 17, 2018
- Carl Zeiss Microscopy GmbH
- Klaus Hegele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Printed circuit board multipole for ion focusing
- Patent number 9,230,789
- Issue date Jan 5, 2016
- Carl Zeiss Microscopy GmbH
- Alexander Laue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for mass selective determination of an ion
- Patent number 9,035,245
- Issue date May 19, 2015
- Carl Zeiss Microscopy GmbH
- Albrecht Glasmachers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope for generating material data
- Patent number 8,766,219
- Issue date Jul 1, 2014
- Carl Zeiss Microscopy GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE DETECTOR FOR DETECTING CHARGED PARTICLES
- Publication number 20230114569
- Publication date Apr 13, 2023
- Leybold GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS
- Publication number 20230047921
- Publication date Feb 16, 2023
- Carl Zeiss SMT GMBH
- Michel Aliman
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ION TRAP WITH RING-SHAPED ION STORAGE CELL AND MASS SPECTROMETER
- Publication number 20220367168
- Publication date Nov 17, 2022
- Leybold GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE AND MASS SPECTROMETER
- Publication number 20220230865
- Publication date Jul 21, 2022
- Leybold GmbH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR ANALYSING A GAS BY MASS SPECTROMETRY
- Publication number 20220005682
- Publication date Jan 6, 2022
- Leybold GmbH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING A GAS BY MASS SPECTROMETRY, AND MASS SPECTROMETER
- Publication number 20200090920
- Publication date Mar 19, 2020
- Carl Zeiss SMT GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EXAMINING A GAS BY MASS SPECTROMETRY AND MASS SPECTROMETER
- Publication number 20180068842
- Publication date Mar 8, 2018
- Carl Zeiss SMT GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE WITH MASS SPECTROMETER THEREWITH
- Publication number 20170278690
- Publication date Sep 28, 2017
- Carl Zeiss SMT GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM AP...
- Publication number 20170236683
- Publication date Aug 17, 2017
- CARL ZEISS MICROSCOPY GMBH
- Klaus Hegele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MASS SPECTROMETRIC EXAMINATION OF GAS MIXTURES AND MASS...
- Publication number 20160372310
- Publication date Dec 22, 2016
- Carl Zeiss SMT GMBH
- Hin Yiu Anthony Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER, USE THEREOF, AND METHOD FOR THE MASS SPECTROMETR...
- Publication number 20160111269
- Publication date Apr 21, 2016
- CARL ZEISS MICROSCOPY GMBH
- Gennady Fedosenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for focusing and for storage of ions and for separation o...
- Publication number 20160020064
- Publication date Jan 21, 2016
- CARL ZEISS MICROSCOPY GMBH
- Alexander Laue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MASS SPECTROMETRIC EXAMINATION OF GAS MIXTURES AND MASS...
- Publication number 20150235829
- Publication date Aug 20, 2015
- Carl Zeiss SMT GMBH
- Hin Yiu Anthony Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR MASS SELECTIVE DETERMINATION OF AN ION
- Publication number 20140339424
- Publication date Nov 20, 2014
- CARL ZEISS MICROSCOPY GMBH
- Albrecht Glasmachers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRINTED CIRCUIT BOARD MULTIPOLE UNITS USED FOR ION TRANSPORTATION
- Publication number 20140326874
- Publication date Nov 6, 2014
- CARL ZEISS MICROSCOPY GMBH
- Albrecht Glasmachers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR SURFACE PROCESSING OF A SUBSTRATE
- Publication number 20140299577
- Publication date Oct 9, 2014
- Hin Yiu Anthony Chung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PARTICLE BEAM MICROSCOPE FOR GENERATING MATERIAL DATA
- Publication number 20140070099
- Publication date Mar 13, 2014
- CARL ZEISS MICROSCOPY GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for focusing and for storage of ions and for separation o...
- Publication number 20110220788
- Publication date Sep 15, 2011
- Alexander Laue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for transmission of energy and/or for transportation of a...
- Publication number 20110192973
- Publication date Aug 11, 2011
- Albrecht Glasmachers
- H01 - BASIC ELECTRIC ELEMENTS

Michel Aliman

Person

Patents Grantslast 30 patents

Ionization device and mass spectrometer

Ion trap with ring-shaped ion storage cell and mass spectrometer

Method for analyzing a gas by mass spectrometry, and mass spectrometer

Method for mass spectrometric examination of gas mixtures and mass...

Mass spectrometer, use thereof, and method for the mass spectrometr...

Ionization device with mass spectrometer therewith

Method for examining a gas by mass spectrometry and mass spectrometer

Particle beam apparatus and method for operating a particle beam ap...

Printed circuit board multipole for ion focusing

Device for mass selective determination of an ion

Particle beam microscope for generating material data

Patents Applicationslast 30 patents

PARTICLE DETECTOR FOR DETECTING CHARGED PARTICLES

DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS

ION TRAP WITH RING-SHAPED ION STORAGE CELL AND MASS SPECTROMETER

IONIZATION DEVICE AND MASS SPECTROMETER

MASS SPECTROMETER AND METHOD FOR ANALYSING A GAS BY MASS SPECTROMETRY

METHOD FOR ANALYZING A GAS BY MASS SPECTROMETRY, AND MASS SPECTROMETER

METHOD FOR EXAMINING A GAS BY MASS SPECTROMETRY AND MASS SPECTROMETER

IONIZATION DEVICE WITH MASS SPECTROMETER THEREWITH

PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM AP...

METHOD FOR MASS SPECTROMETRIC EXAMINATION OF GAS MIXTURES AND MASS...

MASS SPECTROMETER, USE THEREOF, AND METHOD FOR THE MASS SPECTROMETR...

Apparatus for focusing and for storage of ions and for separation o...

METHOD FOR MASS SPECTROMETRIC EXAMINATION OF GAS MIXTURES AND MASS...

DEVICE FOR MASS SELECTIVE DETERMINATION OF AN ION

PRINTED CIRCUIT BOARD MULTIPOLE UNITS USED FOR ION TRANSPORTATION

APPARATUS AND METHOD FOR SURFACE PROCESSING OF A SUBSTRATE

PARTICLE BEAM MICROSCOPE FOR GENERATING MATERIAL DATA

Apparatus for focusing and for storage of ions and for separation o...

Apparatus for transmission of energy and/or for transportation of a...