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Michel Epsztein
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Lexington, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Methods and apparatus for statistical characterization of nano-part...
Patent number
8,119,985
Issue date
Feb 21, 2012
FEI Company
Diane K. Stewart
B82 - NANO-TECHNOLOGY
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Patent Grant
Methods and apparatus for statistical characterization of nano-part...
Patent number
7,544,938
Issue date
Jun 9, 2009
FEI, Company
Diane K. Stewart
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Methods and Apparatus for Statistical Characterization of Nano-Part...
Publication number
20090326866
Publication date
Dec 31, 2009
FEI Company
Diane K. Stewart
G01 - MEASURING TESTING