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Michel Janus
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Kirchentellinsfurt, DE
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last 30 patents
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Patent Application
Computer-Implemented Method for Determining a Quality State of a Wafer
Publication number
20240353473
Publication date
Oct 24, 2024
ROBERT BOSCH GmbH
Jonas Bergdolt
G01 - MEASURING TESTING
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Patent Application
TEST SEQUENCE FOR STOP-AT-FIRST-FAIL TESTING
Publication number
20240264930
Publication date
Aug 8, 2024
ROBERT BOSCH GmbH
Sebastian Bayer
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Method for Fault Analysis in Wafers
Publication number
20240264090
Publication date
Aug 8, 2024
ROBERT BOSCH GmbH
Waldemar Smirnov
G01 - MEASURING TESTING
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Patent Application
Method for Waiting Time Prediction in Semiconductor Factory
Publication number
20230260056
Publication date
Aug 17, 2023
ROBERT BOSCH GmbH
Kai Schelthoff
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Reconstructing the Position of Semiconduct...
Publication number
20230066599
Publication date
Mar 2, 2023
ROBERT BOSCH GmbH
Andreas Steimer
G06 - COMPUTING CALCULATING COUNTING