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MICHEL PAUL JURRIAAN JURRISSEN
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EINDHOVEN, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Parallel multi-slice MR imaging
Patent number
11,112,475
Issue date
Sep 7, 2021
Koninklijke Philips N.V.
Michel Paul Jurriaan Jurrissen
G01 - MEASURING TESTING
Information
Patent Grant
EPI ghost correction involving sense
Patent number
10,241,184
Issue date
Mar 26, 2019
Koninklijke Philips N.V.
Michel Paul Jurriaan Jurrissen
G01 - MEASURING TESTING
Information
Patent Grant
Metal resistant MR imaging
Patent number
10,203,394
Issue date
Feb 12, 2019
Koninklijke Philips N.V.
Michel Paul Jurriaan Jurrissen
G01 - MEASURING TESTING
Information
Patent Grant
Automatic optimization of parallel imaging acceleration parameters
Patent number
10,107,884
Issue date
Oct 23, 2018
Koninklijke Philips N.V.
Peter Boernert
G01 - MEASURING TESTING
Information
Patent Grant
MR imaging using parallel signal acquisition
Patent number
8,866,476
Issue date
Oct 21, 2014
Koninklijke Philips N.V.
Miha Fuderer
G01 - MEASURING TESTING
Information
Patent Grant
Coil selection for parallel magnetic resonance imaging
Patent number
8,502,535
Issue date
Aug 6, 2013
Koninklijke Philips N.V.
Michel Paul Jurriaan Jurrissen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging method with sub-sampled acquisition
Patent number
6,518,760
Issue date
Feb 11, 2003
Koninklijke Philips Electronics N.V.
Miha Fuderer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PARALLEL MULTI-SLICE MR IMAGING
Publication number
20200088822
Publication date
Mar 19, 2020
Koninklijke Philips N.V.
Michel Paul Jurriaan Jurrissen
G01 - MEASURING TESTING
Information
Patent Application
EPI GHOST CORRECTION INVOLVING SENSE
Publication number
20170108571
Publication date
Apr 20, 2017
MICHEL PAUL JURRIAAN JURRISSEN
G01 - MEASURING TESTING
Information
Patent Application
DIXON MAGNETIC RESONANCE IMAGING
Publication number
20160216352
Publication date
Jul 28, 2016
HOLGER EGGERS
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC OPTIMIZATION OF PARALLEL IMAGING ACCELERATION PARAMETERS
Publication number
20160018498
Publication date
Jan 21, 2016
Koninklijke Philips N.V.
PETER BOERNERT
G01 - MEASURING TESTING
Information
Patent Application
METAL RESISTANT MR IMAGING
Publication number
20150362576
Publication date
Dec 17, 2015
PHILIPS GMBH
MICHEL PAUL JURRIAAN JURRISSEN
G01 - MEASURING TESTING
Information
Patent Application
Magnetic resonance imaging method with sub-sampled acquisition
Publication number
20020039024
Publication date
Apr 4, 2002
Miha Fuderer
G01 - MEASURING TESTING