Michel Vallet

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Vaulnaveys le Haut, FR

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit having at least one metallization level
- Patent number 7,196,421
- Issue date Mar 27, 2007
- STMicroelectronics S.A.
- Michel Vallet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor circuit having surface features and method of adjusti...
- Patent number 6,539,276
- Issue date Mar 25, 2003
- STMicroelectronics S.A.
- Michel Vallet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit test pad
- Patent number 6,246,072
- Issue date Jun 12, 2001
- STMicroelectronics S.A.
- Michel Vallet
- G01 - MEASURING TESTING
Information Patent Grant
Test area with automatic positioning of a microprobe and a method o...
- Patent number 6,211,688
- Issue date Apr 3, 2001
- STMicroelectronics S.A.
- Michel Vallet
- G01 - MEASURING TESTING
Information Patent Grant
Procedure and apparatus for measuring the DC voltage of circuits by...
- Patent number 6,175,240
- Issue date Jan 16, 2001
- STMicroelectronics S.A.
- Michel Vallet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test structure for integrated electronic circuits
- Publication number 20060157699
- Publication date Jul 20, 2006
- STMicroelectronics S.A.
- Michel Vallet
- G02 - OPTICS
Information Patent Application
Integrated circuit and associated test method
- Publication number 20050029661
- Publication date Feb 10, 2005
- STMicroelectronics S.A.
- Michel Vallet
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit having at least one metallization level
- Publication number 20050006772
- Publication date Jan 13, 2005
- STMicroelectronics S.A.
- Michel Vallet
- H01 - BASIC ELECTRIC ELEMENTS