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Michele L. Miera
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Gilbert, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Transistor with shield system including multilayer shield structure...
Patent number
11,430,743
Issue date
Aug 30, 2022
NXP USA, INC.
Humayun Kabir
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Impedance matching circuit for RF devices and method therefor
Patent number
10,707,180
Issue date
Jul 7, 2020
NXP USA, INC.
Ricardo Uscola
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for achieving semiconductor-based circuits or sys...
Patent number
10,141,227
Issue date
Nov 27, 2018
NXP USA, INC.
Jose Luis Suarez
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Die crack detector with integrated one-time programmable element
Patent number
9,646,897
Issue date
May 9, 2017
NXP USA, INC.
Audel A. Sanchez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
LDMOS minority carrier shunting
Patent number
9,123,804
Issue date
Sep 1, 2015
FREESCALE SEMICONDUCTOR, INC.
Xiaowei Ren
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
LDMOS device with minority carrier shunt region
Patent number
8,772,870
Issue date
Jul 8, 2014
FREESCALE SEMICONDUCTOR, INC.
Xiaowei Ren
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Electronic elements and devices with trench under bond pad feature
Patent number
8,134,241
Issue date
Mar 13, 2012
FREESCALE SEMICONDUCTOR, INC.
Jeffrey K. Jones
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for forming an RF device with trench under bond pad feature
Patent number
7,998,852
Issue date
Aug 16, 2011
FREESCALE SEMICONDUCTOR, INC.
Jeffrey K. Jones
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
IMPEDANCE MATCHING CIRCUIT FOR RF DEVICES AND METHOD THEREFOR
Publication number
20190326233
Publication date
Oct 24, 2019
NXP USA, Inc.
Ricardo Uscola
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIE CRACK DETECTOR WITH INTEGRATED ONE-TIME PROGRAMMABLE ELEMENT
Publication number
20150115266
Publication date
Apr 30, 2015
FREESCALE SEMICONDUCTOR, INC.
Audel A. SANCHEZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LDMOS DEVICE WITH MINORITY CARRIER SHUNT REGION
Publication number
20140284716
Publication date
Sep 25, 2014
FREESCALE SEMICONDUCTOR, INC.
Xiaowei Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LDMOS Device with Minority Carrier Shunt Region
Publication number
20140117446
Publication date
May 1, 2014
Xiaowei Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC ELEMENTS AND DEVICES WITH TRENCH UNDER BOND PAD FEATURE
Publication number
20110266687
Publication date
Nov 3, 2011
FREESCALE SEMICONDUCTOR, INC.
Jeffrey K. Jones
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RF DEVICE AND METHOD WITH TRENCH UNDER BOND PAD FEATURE
Publication number
20100140814
Publication date
Jun 10, 2010
FREESCALE SEMICONDUCTOR, INC.
Jeffrey K. Jones
H01 - BASIC ELECTRIC ELEMENTS