Michele Piccardi

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charge loss compensation during read operations in a memory device
- Patent number 12,057,174
- Issue date Aug 6, 2024
- Micron Technology, Inc.
- Vivek Venkata Kalluru
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power management for sleep mode operation of a memory device
- Patent number 12,027,227
- Issue date Jul 2, 2024
- Micron Technology, Inc.
- Shuai Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect detection during program verify in a memory sub-system
- Patent number 12,002,526
- Issue date Jun 4, 2024
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for on-chip stress detection
- Patent number 11,978,680
- Issue date May 7, 2024
- Micron Technology, Inc.
- Kenneth William Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Managing digitally-controlled charge pump operation in a memory sub...
- Patent number 11,948,647
- Issue date Apr 2, 2024
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Functional signal line overdrive
- Patent number 11,942,164
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with detection of out-of-range operating temperature
- Patent number 11,881,282
- Issue date Jan 23, 2024
- Micron Technology, Inc.
- Yui Shimizu
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage regulation
- Patent number 11,869,603
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Shuai Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Peak current reduction using dynamic clocking during charge pump re...
- Patent number 11,763,858
- Issue date Sep 19, 2023
- Micron Technology, Inc.
- Vivek Venkata Kalluru
- G11 - INFORMATION STORAGE
Information Patent Grant
Power architecture for non-volatile memory
- Patent number 11,763,895
- Issue date Sep 19, 2023
- Micron Technology, Inc.
- Qisong Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NAND flash array defect real time detection
- Patent number 11,710,533
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature readings for memory devices to reduce temperature compe...
- Patent number 11,704,047
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Agostino Macerola
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Standby biasing techniques to reduce read disturbs
- Patent number 11,688,468
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory cell programming including applying programming pulses of di...
- Patent number 11,670,346
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Chang H. Siau
- G11 - INFORMATION STORAGE
Information Patent Grant
Stage protection in multi-stage charge pumps
- Patent number 11,652,409
- Issue date May 16, 2023
- Micron Technology, Inc.
- Michele Piccardi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Resistor-capacitor sensor circuit
- Patent number 11,631,319
- Issue date Apr 18, 2023
- Micron Technology, Inc.
- Pin-Chou Chiang
- G08 - SIGNALLING
Information Patent Grant
Selective overdrive of supply voltage to primary switch for program...
- Patent number 11,615,853
- Issue date Mar 28, 2023
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Low-voltage bias generator based on high-voltage supply
- Patent number 11,573,588
- Issue date Feb 7, 2023
- Micron Technology, Inc.
- Michele Piccardi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Peak current management in a memory array
- Patent number 11,495,306
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Peak current reduction using dynamic clocking during charge pump re...
- Patent number 11,443,778
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Vivek Venkata Kalluru
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing digitally-controlled charge pump operation in a memory sub...
- Patent number 11,443,816
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND flash array defect real time detection
- Patent number 11,437,117
- Issue date Sep 6, 2022
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit devices for driving conductors to target voltage...
- Patent number 11,410,726
- Issue date Aug 9, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Power architecture for non-volatile memory
- Patent number 11,404,129
- Issue date Aug 2, 2022
- Micron Technology, Inc.
- Qisong Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective overdrive of supply voltage to primary switch for program...
- Patent number 11,380,408
- Issue date Jul 5, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memories having multiple voltage generation systems connected to a...
- Patent number 11,335,415
- Issue date May 17, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Stage protection in multi-stage charge pumps
- Patent number 11,323,027
- Issue date May 3, 2022
- Micron Technology, Inc.
- Michele Piccardi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Memory devices including voltage generation systems
- Patent number 11,322,209
- Issue date May 3, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods providing improved calibration of memory contro...
- Patent number 11,315,642
- Issue date Apr 26, 2022
- Micron Technology, Inc.
- Kalyan Kavalipurapu
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect detection during program verify in a memory sub-system
- Patent number 11,315,647
- Issue date Apr 26, 2022
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CHARGE LOSS COMPENSATION DURING READ OPERATIONS IN A MEMORY DEVICE
- Publication number 20240355397
- Publication date Oct 24, 2024
- Micron Technology, Inc.
- Vivek Venkata Kalluru
- G11 - INFORMATION STORAGE
Information Patent Application
LOW POWER MANAGEMENT FOR SLEEP MODE OPERATION OF A MEMORY DEVICE
- Publication number 20240312494
- Publication date Sep 19, 2024
- Micron Technology, Inc.
- Shuai Xu
- G11 - INFORMATION STORAGE
Information Patent Application
LOW POWER MANAGEMENT FOR SLEEP MODE OPERATION OF A MEMORY DEVICE
- Publication number 20230317120
- Publication date Oct 5, 2023
- Micron Technology, Inc.
- Shuai Xu
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING DIGITALLY-CONTROLLED CHARGE PUMP OPERATION IN A MEMORY SUB...
- Publication number 20230116024
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DETECTION OF OUT-OF-RANGE OPERATING TEMPERATURE
- Publication number 20230063585
- Publication date Mar 2, 2023
- Micron Technology, Inc.
- Yui Shimizu
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGE LOSS COMPENSATION DURING READ OPERATIONS IN A MEMORY DEVICE
- Publication number 20230057289
- Publication date Feb 23, 2023
- Micron Technology, Inc.
- Vivek Venkata Kalluru
- G11 - INFORMATION STORAGE
Information Patent Application
INDEPENDENT PLANE ARCHITECTURE IN A MEMORY DEVICE
- Publication number 20230059543
- Publication date Feb 23, 2023
- Micron Technology, Inc.
- Andrea Giovanni Xotta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES AND ELECTRONIC...
- Publication number 20230047662
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Erwin E. Yu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
VOLTAGE REGULATION
- Publication number 20230046421
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Shuai Xu
- G11 - INFORMATION STORAGE
Information Patent Application
WELL RING FOR RESISTIVE GROUND POWER DOMAIN SEGREGATION
- Publication number 20230017305
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Mattia Cichocki
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE READINGS FOR MEMORY DEVICES TO REDUCE TEMPERATURE COMPE...
- Publication number 20220405002
- Publication date Dec 22, 2022
- Micron Technology, Inc.
- Agostino Macerola
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PEAK CURRENT REDUCTION USING DYNAMIC CLOCKING DURING CHARGE PUMP RE...
- Publication number 20220392498
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Vivek Venkata Kalluru
- G11 - INFORMATION STORAGE
Information Patent Application
NAND FLASH ARRAY DEFECT REAL TIME DETECTION
- Publication number 20220367000
- Publication date Nov 17, 2022
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTIVE OVERDRIVE OF SUPPLY VOLTAGE TO PRIMARY SWITCH FOR PROGRAM...
- Publication number 20220301638
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
POWER ARCHITECTURE FOR NON-VOLATILE MEMORY
- Publication number 20220254418
- Publication date Aug 11, 2022
- Micron Technology, Inc.
- Qisong Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STAGE PROTECTION IN MULTI-STAGE CHARGE PUMPS
- Publication number 20220247308
- Publication date Aug 4, 2022
- Micron Technology, Inc.
- Michele Piccardi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEFECT DETECTION DURING PROGRAM VERIFY IN A MEMORY SUB-SYSTEM
- Publication number 20220223215
- Publication date Jul 14, 2022
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Application
LOW-VOLTAGE BIAS GENERATOR BASED ON HIGH-VOLTAGE SUPPLY
- Publication number 20220197323
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTIVE OVERDRIVE OF SUPPLY VOLTAGE TO PRIMARY SWITCH FOR PROGRAM...
- Publication number 20220172789
- Publication date Jun 2, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING DIGITALLY-CONTROLLED CHARGE PUMP OPERATION IN A MEMORY SUB...
- Publication number 20220172788
- Publication date Jun 2, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
EXTRACTING THE RESISTOR-CAPACITOR TIME CONSTANT OF AN ELECTRONIC CI...
- Publication number 20220108600
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- Pin-Chou Chiang
- G08 - SIGNALLING
Information Patent Application
METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION
- Publication number 20220084896
- Publication date Mar 17, 2022
- Micron Technology, Inc.
- Kenneth William Marr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL PROGRAMMING
- Publication number 20220068325
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Chang H. Siau
- G11 - INFORMATION STORAGE
Information Patent Application
FUNCTIONAL SIGNAL LINE OVERDRIVE
- Publication number 20220044740
- Publication date Feb 10, 2022
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
NAND FLASH ARRAY DEFECT REAL TIME DETECTION
- Publication number 20210375386
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Xiaojiang Guo
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods for Performing Dynamic On-Chip Calibration of M...
- Publication number 20210375350
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
STANDBY BIASING TECHNIQUES TO REDUCE READ DISTURBS
- Publication number 20210375375
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECT DETECTION DURING PROGRAM VERIFY IN A MEMORY SUB-SYSTEM
- Publication number 20210343351
- Publication date Nov 4, 2021
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Application
RESISTOR-CAPACITOR SENSOR CIRCUIT
- Publication number 20210335125
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Pin-Chou Chiang
- G08 - SIGNALLING
Information Patent Application
MEMORY DEVICES INCLUDING VOLTAGE GENERATION SYSTEMS
- Publication number 20210272635
- Publication date Sep 2, 2021
- Micron Technology, Inc.
- Michele Piccardi
- G11 - INFORMATION STORAGE

Michele Piccardi

Person

Patents Grantslast 30 patents

Charge loss compensation during read operations in a memory device

Low power management for sleep mode operation of a memory device

Defect detection during program verify in a memory sub-system

Method and apparatus for on-chip stress detection

Managing digitally-controlled charge pump operation in a memory sub...

Functional signal line overdrive

Memory device with detection of out-of-range operating temperature

Voltage regulation

Peak current reduction using dynamic clocking during charge pump re...

Power architecture for non-volatile memory

NAND flash array defect real time detection

Temperature readings for memory devices to reduce temperature compe...

Standby biasing techniques to reduce read disturbs

Memory cell programming including applying programming pulses of di...

Stage protection in multi-stage charge pumps

Resistor-capacitor sensor circuit

Selective overdrive of supply voltage to primary switch for program...

Low-voltage bias generator based on high-voltage supply

Peak current management in a memory array

Peak current reduction using dynamic clocking during charge pump re...

Managing digitally-controlled charge pump operation in a memory sub...

NAND flash array defect real time detection

Integrated circuit devices for driving conductors to target voltage...

Power architecture for non-volatile memory

Selective overdrive of supply voltage to primary switch for program...

Memories having multiple voltage generation systems connected to a...

Stage protection in multi-stage charge pumps

Memory devices including voltage generation systems

Systems and methods providing improved calibration of memory contro...

Defect detection during program verify in a memory sub-system

Patents Applicationslast 30 patents

CHARGE LOSS COMPENSATION DURING READ OPERATIONS IN A MEMORY DEVICE

LOW POWER MANAGEMENT FOR SLEEP MODE OPERATION OF A MEMORY DEVICE

LOW POWER MANAGEMENT FOR SLEEP MODE OPERATION OF A MEMORY DEVICE

MANAGING DIGITALLY-CONTROLLED CHARGE PUMP OPERATION IN A MEMORY SUB...

MEMORY DEVICE WITH DETECTION OF OUT-OF-RANGE OPERATING TEMPERATURE

CHARGE LOSS COMPENSATION DURING READ OPERATIONS IN A MEMORY DEVICE

INDEPENDENT PLANE ARCHITECTURE IN A MEMORY DEVICE

MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES AND ELECTRONIC...

VOLTAGE REGULATION

WELL RING FOR RESISTIVE GROUND POWER DOMAIN SEGREGATION

TEMPERATURE READINGS FOR MEMORY DEVICES TO REDUCE TEMPERATURE COMPE...

PEAK CURRENT REDUCTION USING DYNAMIC CLOCKING DURING CHARGE PUMP RE...

NAND FLASH ARRAY DEFECT REAL TIME DETECTION

SELECTIVE OVERDRIVE OF SUPPLY VOLTAGE TO PRIMARY SWITCH FOR PROGRAM...

POWER ARCHITECTURE FOR NON-VOLATILE MEMORY

STAGE PROTECTION IN MULTI-STAGE CHARGE PUMPS

DEFECT DETECTION DURING PROGRAM VERIFY IN A MEMORY SUB-SYSTEM

LOW-VOLTAGE BIAS GENERATOR BASED ON HIGH-VOLTAGE SUPPLY

SELECTIVE OVERDRIVE OF SUPPLY VOLTAGE TO PRIMARY SWITCH FOR PROGRAM...

MANAGING DIGITALLY-CONTROLLED CHARGE PUMP OPERATION IN A MEMORY SUB...

EXTRACTING THE RESISTOR-CAPACITOR TIME CONSTANT OF AN ELECTRONIC CI...

METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION

MEMORY CELL PROGRAMMING

FUNCTIONAL SIGNAL LINE OVERDRIVE

NAND FLASH ARRAY DEFECT REAL TIME DETECTION

Systems and Methods for Performing Dynamic On-Chip Calibration of M...

STANDBY BIASING TECHNIQUES TO REDUCE READ DISTURBS

DEFECT DETECTION DURING PROGRAM VERIFY IN A MEMORY SUB-SYSTEM

RESISTOR-CAPACITOR SENSOR CIRCUIT

MEMORY DEVICES INCLUDING VOLTAGE GENERATION SYSTEMS