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Blandshardstown, IE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for system testing using multiple processors
Patent number
8,677,198
Issue date
Mar 18, 2014
Alcatel Lucent
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for virtual in-circuit emulation
Patent number
8,621,301
Issue date
Dec 31, 2013
Alcatel Lucent
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for system testing using multiple instruction...
Patent number
8,533,545
Issue date
Sep 10, 2013
Alcatel Lucent
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for providing scan chain security
Patent number
8,495,758
Issue date
Jul 23, 2013
Alcatel Lucent
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for describing components adapted for dynamica...
Patent number
7,962,885
Issue date
Jun 14, 2011
Alcatel-Lucent USA Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for describing and testing a system-on-chip
Patent number
7,958,479
Issue date
Jun 7, 2011
Alcatel-Lucent USA Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for isolating portions of a scan path of a sys...
Patent number
7,958,417
Issue date
Jun 7, 2011
Alcatel-Lucent USA Inc.
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for controlling dynamic modification of a scan...
Patent number
7,954,022
Issue date
May 31, 2011
Alcatel-Lucent USA Inc.
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for describing parallel access to a system-on-...
Patent number
7,949,915
Issue date
May 24, 2011
Alcatel-Lucent USA Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR PROVIDING SCAN CHAIN SECURITY
Publication number
20110314514
Publication date
Dec 22, 2011
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR VIRTUAL IN-CIRCUIT EMULATION
Publication number
20100293423
Publication date
Nov 18, 2010
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SYSTEM TESTING USING SCAN CHAIN DECOMPOSITION
Publication number
20100229058
Publication date
Sep 9, 2010
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SYSTEM TESTING USING MULTIPLE INSTRUCTION...
Publication number
20100229036
Publication date
Sep 9, 2010
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SYSTEM TESTING USING MULTIPLE PROCESSORS
Publication number
20100229042
Publication date
Sep 9, 2010
Suresh Goyal
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR CONTROLLING DYNAMIC MODIFICATION OF A SCAN...
Publication number
20090193306
Publication date
Jul 30, 2009
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Isolating Portions of a Scan Path of a Sys...
Publication number
20090193304
Publication date
Jul 30, 2009
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for describing parallel access to a system-on-...
Publication number
20090144593
Publication date
Jun 4, 2009
Tapan J. Chakraborty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Describing Components Adapted for Dynamica...
Publication number
20090144592
Publication date
Jun 4, 2009
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DESCRIBING AND TESTING A SYSTEM-ON-CHIP
Publication number
20090144594
Publication date
Jun 4, 2009
Tapan J. Chakraborty
G06 - COMPUTING CALCULATING COUNTING