Michelle L. Baldwin

Person

Mount Juliet, TN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems, methods and devices for high-speed input/output margin tes...
- Patent number 11,940,483
- Issue date Mar 26, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement system for analyzing devices under test
- Patent number 11,782,809
- Issue date Oct 10, 2023
- Tektronix, Inc.
- Sam J. Strickling
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST AND MEASUREMENT SYSTEM FOR ANALYZING DEVICES UNDER TEST
- Publication number 20240004768
- Publication date Jan 4, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MARGIN TEST DATA TAGGING AND PREDICTIVE EXPECTED MARGINS
- Publication number 20220091185
- Publication date Mar 24, 2022
- Tektronix, Inc.
- Sam J. Strickling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CABLE CONDITION INDICATOR
- Publication number 20220034975
- Publication date Feb 3, 2022
- Tektronix, Inc.
- Sam J. Strickling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLEXER-ENABLED CABLES AND TEST FIXTURES
- Publication number 20220034967
- Publication date Feb 3, 2022
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TES...
- Publication number 20210405108
- Publication date Dec 30, 2021
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM FOR ANALYZING DEVICES UNDER TEST
- Publication number 20210406144
- Publication date Dec 30, 2021
- Tektronix, Inc.
- Sam J. Strickling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED RECOGNITION OF A DEVICE UNDER TEST
- Publication number 20210297882
- Publication date Sep 23, 2021
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING

Michelle L. Baldwin

Person

Patents Grantslast 30 patents

Systems, methods and devices for high-speed input/output margin tes...

Test and measurement system for analyzing devices under test

Patents Applicationslast 30 patents

TEST AND MEASUREMENT SYSTEM FOR ANALYZING DEVICES UNDER TEST

MARGIN TEST DATA TAGGING AND PREDICTIVE EXPECTED MARGINS

CABLE CONDITION INDICATOR

MULTIPLEXER-ENABLED CABLES AND TEST FIXTURES

SYSTEMS, METHODS AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TES...

TEST AND MEASUREMENT SYSTEM FOR ANALYZING DEVICES UNDER TEST

AUTOMATED RECOGNITION OF A DEVICE UNDER TEST