Michelle SANPEDRO

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for processing a substrate
- Patent number 12,368,024
- Issue date Jul 22, 2025
- Applied Materials, Inc.
- Abdullah Zafar
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
RF measurement from a transmission line sensor
- Patent number 12,061,215
- Issue date Aug 13, 2024
- Applied Materials, Inc.
- David Coumou
- G01 - MEASURING TESTING
Information Patent Grant
Multiple reflectometry for measuring etch parameters
- Patent number 11,927,543
- Issue date Mar 12, 2024
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Multiple reflectometry for measuring etch parameters
- Patent number 11,619,594
- Issue date Apr 4, 2023
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RF MEASUREMENT FROM A TRANSMISSION LINE SENSOR
- Publication number 20240393373
- Publication date Nov 28, 2024
- Applied Materials, Inc.
- David Coumou
- G01 - MEASURING TESTING
Information Patent Application
RF MEASUREMENT FROM A TRANSMISSION LINE SENSOR
- Publication number 20230358790
- Publication date Nov 9, 2023
- Applied Materials, Inc.
- David Coumou
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
- Publication number 20230168210
- Publication date Jun 1, 2023
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
- Publication number 20220349833
- Publication date Nov 3, 2022
- Applied Materials, Inc.
- Blake Erickson
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE
- Publication number 20220328285
- Publication date Oct 13, 2022
- Abdullah ZAFAR
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...