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Michiel Alexander Hallie
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Nijmegen, NL
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last 30 patents
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Patent Grant
Bias generator testing using grouped bias currents
Patent number
12,174,253
Issue date
Dec 24, 2024
NXP B.V.
Cristian Pavao Moreira
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
BIAS GENERATOR TESTING USING GROUPED BIAS CURRENTS
Publication number
20230333161
Publication date
Oct 19, 2023
NXP B.V.
Cristian Pavao Moreira
G01 - MEASURING TESTING