Michiel Pertijs

Person

Delft, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Capaticance-to-digital converter
- Patent number 10,732,577
- Issue date Aug 4, 2020
- NXP B.V.
- Hao Fan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Ratiometric device
- Patent number 9,835,575
- Issue date Dec 5, 2017
- ams International AG
- Zeyu Cai
- G01 - MEASURING TESTING
Information Patent Grant
Autozeroing current feedback instrumentation amplifier
- Patent number 7,719,351
- Issue date May 18, 2010
- National Semiconductor Corporation
- Michiel Pertijs
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital temperature sensors and calibration thereof
- Patent number 7,674,035
- Issue date Mar 9, 2010
- NXP B.V.
- Michiel Pertijs
- G01 - MEASURING TESTING
Information Patent Grant
Autozeroing current feedback instrumentation amplifier
- Patent number 7,573,327
- Issue date Aug 11, 2009
- National Semiconductor Corporation
- Michiel Pertijs
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Bias circuits
- Patent number 7,446,598
- Issue date Nov 4, 2008
- NXP B.V.
- Michiel Pertijs
- G01 - MEASURING TESTING
Information Patent Grant
Bitstream controlled reference signal generation for a sigma-delta...
- Patent number 7,391,351
- Issue date Jun 24, 2008
- NXP B.V.
- Michiel A. P. Pertijs
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Non-linear signal correction
- Patent number 6,456,145
- Issue date Sep 24, 2002
- Koninklijke Philips Electronics N.V.
- Michiel A. P. Pertijs
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
CAPATICANCE-TO-DIGITAL CONVERTER
- Publication number 20200073334
- Publication date Mar 5, 2020
- NXP B.V.
- Hao Fan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
RATIOMETRIC DEVICE
- Publication number 20160109396
- Publication date Apr 21, 2016
- ams International AG
- Zeyu Cai
- G01 - MEASURING TESTING
Information Patent Application
Ovenized System Containing Micro-Electromechanical Resonator
- Publication number 20130127552
- Publication date May 23, 2013
- IMEC
- Jonathan Borremans
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Oven Controlled MEMS Oscillator Device
- Publication number 20120305542
- Publication date Dec 6, 2012
- IMEC
- Stephane Donnay
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Autozeroing current feedback instrumentation amplifier
- Publication number 20080284507
- Publication date Nov 20, 2008
- National Semiconductor Corporation
- Michiel Pertijs
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Bias Circuits
- Publication number 20080094131
- Publication date Apr 24, 2008
- Koninklijke Philips Electronics N.V.
- Michiel A.P. Pertijs
- G05 - CONTROLLING REGULATING
Information Patent Application
Digital Temperature Sensors and Calibration Thereof
- Publication number 20080069176
- Publication date Mar 20, 2008
- Koninklijke Philips Electronics N.V.
- Michiel A.P. Pertijs
- G01 - MEASURING TESTING
Information Patent Application
Bitstream Controlled Reference Signal Generation for a Sigma-Delta...
- Publication number 20070229331
- Publication date Oct 4, 2007
- Koninklijke Philips electtronics, N.V.
- Michiel A.P. Pertijs
- H03 - BASIC ELECTRONIC CIRCUITRY

Michiel Pertijs

Person

Patents Grantslast 30 patents

Capaticance-to-digital converter

Ratiometric device

Autozeroing current feedback instrumentation amplifier

Digital temperature sensors and calibration thereof

Autozeroing current feedback instrumentation amplifier

Bias circuits

Bitstream controlled reference signal generation for a sigma-delta...

Non-linear signal correction

Patents Applicationslast 30 patents

CAPATICANCE-TO-DIGITAL CONVERTER

RATIOMETRIC DEVICE

Ovenized System Containing Micro-Electromechanical Resonator

Oven Controlled MEMS Oscillator Device

Autozeroing current feedback instrumentation amplifier

Bias Circuits

Digital Temperature Sensors and Calibration Thereof

Bitstream Controlled Reference Signal Generation for a Sigma-Delta...