Membership
Tour
Register
Log in
Michiel Timmermans
Follow
Person
Stuttgart, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Imaging device and method
Patent number
11,726,207
Issue date
Aug 15, 2023
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Alper Ercan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TIME-OF-FLIGHT DEVICE AND METHOD
Publication number
20220214433
Publication date
Jul 7, 2022
Sony Semiconductor Solutions Corporation
Michiel Timmermans
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT APPARATUS AND METHOD
Publication number
20220179087
Publication date
Jun 9, 2022
Sony Semiconductor Solutions Corporation
Rachit Mohan
G01 - MEASURING TESTING
Information
Patent Application
IMAGING DEVICE AND METHOD
Publication number
20210157005
Publication date
May 27, 2021
Sony Semiconductor Solutions Corporation
Alper Ercan
G01 - MEASURING TESTING