Michihiko Togashi

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scale of photoelectric encoder including base member having roughen...
- Patent number 9,258,007
- Issue date Feb 9, 2016
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic capacitance probe device and displacement measuring c...
- Patent number 6,538,458
- Issue date Mar 25, 2003
- Mitutoyo Corporation
- Michihiko Togashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCALE OF PHOTOELECTRIC ENCODER AND MANUFACTURING METHOD OF THE SAME
- Publication number 20130127644
- Publication date May 23, 2013
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic capacitance probe device and displacement measuring c...
- Publication number 20020011850
- Publication date Jan 31, 2002
- Michihiko Togashi
- G01 - MEASURING TESTING