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Michihiko Umeda
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Kawasaki, JP
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last 30 patents
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Patent Grant
Method of test of clock generation circuit in electronic device, an...
Patent number
7,272,527
Issue date
Sep 18, 2007
Fujitsu Limited
Hiroyuki Suto
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD OF TEST OF CLOCK GENERATION CIRCUIT IN ELECTRONIC DEVICE, AN...
Publication number
20070233411
Publication date
Oct 4, 2007
FUJITSU LIMITED
Hiroyuki Suto
G01 - MEASURING TESTING