Michihiro Hagiwara

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Layered film fabrication method, layered film defect detection meth...
- Patent number 7,850,801
- Issue date Dec 14, 2010
- Nitto Denko Corporation
- Takamasa Kobayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LAYERED FILM FABRICATION METHOD, LAYERED FILM DEFECT DETECTION METH...
- Publication number 20090288754
- Publication date Nov 26, 2009
- NITTO DENKO CORPORATION
- Takamasa Kobayashi
- G01 - MEASURING TESTING