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Michinobu Nakao
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Hachiouji, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor chip and method of repair design of the same
Patent number
8,400,853
Issue date
Mar 19, 2013
Renesas Electronics Corporation
Chizu Matsumoto
G11 - INFORMATION STORAGE
Information
Patent Grant
Fault test apparatus and method for testing semiconductor device un...
Patent number
7,983,858
Issue date
Jul 19, 2011
Semiconductor Technology Academic Research Center
Yuzo Takamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit and its analyzing method
Patent number
7,036,060
Issue date
Apr 25, 2006
Hitachi, Ltd.
Michinobu Nakao
G01 - MEASURING TESTING
Information
Patent Grant
Test method of semiconductor intergrated circuit and test pattern g...
Patent number
6,922,803
Issue date
Jul 26, 2005
Hitachi, Ltd.
Michinobu Nakao
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit and method of designing the same
Patent number
6,484,294
Issue date
Nov 19, 2002
Hitachi, Ltd.
Yoshikazu Kiyoshige
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing logic circuit test points, apparatus for analyz...
Patent number
6,038,691
Issue date
Mar 14, 2000
Hitachi, Ltd.
Michinobu Nakao
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT WITH MEMORY REPAIR CIRCUIT
Publication number
20110161751
Publication date
Jun 30, 2011
Renesas Electronics Corporation
Hideshi MAENO
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR CHIP AND METHOD OF REPAIR DESIGN OF THE SAME
Publication number
20100290299
Publication date
Nov 18, 2010
Renesas Electronics Corporation
Chizu MATSUMOTO
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT WITH MEMORY REPAIR CIRCUIT
Publication number
20090158087
Publication date
Jun 18, 2009
RENESAS TECHNOLOGY CORP.
Hideshi Maeno
G11 - INFORMATION STORAGE
Information
Patent Application
Fault test apparatus and method for testing semiconductor device un...
Publication number
20090063062
Publication date
Mar 5, 2009
Yuzo Takamatsu
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit and its analyzing method
Publication number
20030200492
Publication date
Oct 23, 2003
Michinobu Nakao
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit with built-in test function
Publication number
20030070118
Publication date
Apr 10, 2003
Hitachi, Ltd.
Michinobu Nakao
G01 - MEASURING TESTING
Information
Patent Application
Test method of semiconductor intergrated circuit and test pattern g...
Publication number
20020073373
Publication date
Jun 13, 2002
Michinobu Nakao
G01 - MEASURING TESTING