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TOKYO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device for implementing signal transmission and/or po...
Patent number
7,906,846
Issue date
Mar 15, 2011
NEC Corporation
Shigeki Hoshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device testing apparatus and power supply unit for se...
Patent number
7,852,101
Issue date
Dec 14, 2010
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Inspection probe
Patent number
7,548,082
Issue date
Jun 16, 2009
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Inspection probe, method for preparing the same, and method for ins...
Patent number
7,218,131
Issue date
May 15, 2007
Renesas Technology Corp.
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device inspection apparatus and inspection method
Patent number
6,906,546
Issue date
Jun 14, 2005
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Probe for inspecting semiconductor device and method of manufacturi...
Patent number
6,667,627
Issue date
Dec 23, 2003
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device testing apparatus having a contact sheet and p...
Patent number
6,486,688
Issue date
Nov 26, 2002
NEC Corporation
Toru Taura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device tester and method of testing semiconductor device
Patent number
6,433,410
Issue date
Aug 13, 2002
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Bare chip carrier utilizing a pressing member
Patent number
6,426,878
Issue date
Jul 30, 2002
NEC Corporation
Michinobu Tanioka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test carrier and method of mounting semiconductor device thereon
Patent number
6,396,290
Issue date
May 28, 2002
NEC Corporation
Takahiro Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method for mounting a saw device
Patent number
6,078,123
Issue date
Jun 20, 2000
NEC Corporation
Kei Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Surface acoustic wave device mounted with a resin film and method o...
Patent number
6,078,229
Issue date
Jun 20, 2000
NEC Corporation
Yoshitsugu Funada
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Semiconductor device with improved connection reliability
Patent number
6,013,953
Issue date
Jan 11, 2000
NEC Corporation
Toshiyuki Nishihara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MCM (Multi Chip Module) carrier with external connection teminals B...
Patent number
5,784,264
Issue date
Jul 21, 1998
NEC Corporation
Michinobu Tanioka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a flip chip
Patent number
5,668,058
Issue date
Sep 16, 1997
NEC Corporation
Michinobu Tanioka
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20090278246
Publication date
Nov 12, 2009
NEC CORPORATION
Shigeki Hoshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Device Testing Apparatus and Power Supply Unit
Publication number
20080265933
Publication date
Oct 30, 2008
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
Inspection probe
Publication number
20060208752
Publication date
Sep 21, 2006
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
Inspection probe, method for preparing the same, and method for ins...
Publication number
20060082380
Publication date
Apr 20, 2006
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device inspection apparatus and inspection method
Publication number
20040100297
Publication date
May 27, 2004
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
Test probe having a sheet body
Publication number
20030030455
Publication date
Feb 13, 2003
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
Probe for inspecting semiconductor device and method of manufacturi...
Publication number
20020125901
Publication date
Sep 12, 2002
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
SURFACE ELASTIC WAVE DEVICE HAVING BUMPS IN A DEFINITE AREA ON THE...
Publication number
20020057034
Publication date
May 16, 2002
MITSURU ISHIKAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Probe structure and method for manufacturing the same
Publication number
20020053917
Publication date
May 9, 2002
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device testing apparatus
Publication number
20020036514
Publication date
Mar 28, 2002
NEC Corporation
Toru Taura
G01 - MEASURING TESTING
Information
Patent Application
Bare chip carrier and method of checking the bare chip
Publication number
20020012233
Publication date
Jan 31, 2002
Michinobu Tanioka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRIC CONTACT DEVICE FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20010040464
Publication date
Nov 15, 2001
MICHINOBU TANIOKA
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device tester and method of testing semiconductor device
Publication number
20010033010
Publication date
Oct 25, 2001
Michinobu Tanioka
G01 - MEASURING TESTING