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Michio Higuchi
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for measuring suspended particulate matter
Patent number
6,674,528
Issue date
Jan 6, 2004
Shimadzu Corporation
Motoaki Adachi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and apparatus for measuring suspended particulate matter
Publication number
20030016356
Publication date
Jan 23, 2003
Shimadzu Corporation
Motoaki Adachi
G01 - MEASURING TESTING