Michio Maekawa

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Takatsuki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing semiconductor device
- Patent number 6,351,834
- Issue date Feb 26, 2002
- Matsushita Electric Industrial Co., Ltd.
- Michio Maekawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for producing test program for semiconductor device
- Patent number 5,901,154
- Issue date May 4, 1999
- Matasushita Electric Industrial Co., Ltd.
- Masayuki Motohama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-speed interface circuit test module, module under high-speed i...
- Publication number 20050258856
- Publication date Nov 24, 2005
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Kishimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE