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Michio Murata
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Nirasaki City, JP
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Patents Grants
last 30 patents
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Patent Grant
Substrate inspection apparatus
Patent number
10,962,565
Issue date
Mar 30, 2021
Tokyo Electron Limited
Michio Murata
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection apparatus
Patent number
10,114,070
Issue date
Oct 30, 2018
Tokyo Electron Limited
Michio Murata
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection apparatus
Patent number
9,678,107
Issue date
Jun 13, 2017
Tokyo Electron Limited
Shingo Morita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS
Publication number
20190107557
Publication date
Apr 11, 2019
Tokyo Electron Limited
Michio MURATA
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS
Publication number
20150276810
Publication date
Oct 1, 2015
TOKYO ELECTRON LIMITED
Shingo MORITA
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS
Publication number
20150077152
Publication date
Mar 19, 2015
TOKYO ELECTRON LIMITED
Michio Murata
G01 - MEASURING TESTING