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Michio Taguchi
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Tatsuno, JP
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last 30 patents
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Patent Grant
Operational condition setting device for combination weighing machine
Patent number
4,967,383
Issue date
Oct 30, 1990
Yamato Scale Company, Limited
Takashi Hirano
G01 - MEASURING TESTING
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Patent Grant
Span adjusting device for weigher
Patent number
4,792,003
Issue date
Dec 20, 1988
Yamato Scale Company, Limited
Takashi Hirano
G01 - MEASURING TESTING
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Patent Grant
Span adjusting device for weigher
Patent number
4,703,815
Issue date
Nov 3, 1987
Yamato Scale Company, Limited
Takashi Hirano
G01 - MEASURING TESTING