Michio Tajima

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating a semiconductor substrate
- Patent number 7,947,967
- Issue date May 24, 2011
- Japan Aerospace Exploration Agency
- Michio Tajima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING A SEMICONDUCTOR SUBSTRATE
- Publication number 20080213926
- Publication date Sep 4, 2008
- JAPAN AEROSPACE EXPLORATION AGENCY
- Michio Tajima
- G01 - MEASURING TESTING