Michisato Toyoda

Person

Suita-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Droplet particle, and method and device for producing droplet particle
- Patent number 12,025,544
- Issue date Jul 2, 2024
- Osaka University
- Takashi Kimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source, and mass spectroscope provided with same
- Patent number 9,373,474
- Issue date Jun 21, 2016
- Osaka University
- Michisato Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alkali metal introduction apparatus and alkali metal introduction m...
- Patent number 9,117,643
- Issue date Aug 25, 2015
- Osaka University
- Michisato Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cyclone separator type mass analyzing system
- Patent number 8,410,435
- Issue date Apr 2, 2013
- MSI. Tokyo, Inc.
- Shinichi Miki
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring apparatus, distance measuring method, distance m...
- Patent number 8,358,424
- Issue date Jan 22, 2013
- Osaka University
- Michisato Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for time-of-flight mass spectrometry
- Patent number 8,237,112
- Issue date Aug 7, 2012
- Jeol Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for time-of-flight mass spectrometry
- Patent number 7,910,879
- Issue date Mar 22, 2011
- Jeol Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,763,847
- Issue date Jul 27, 2010
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for time-of-flight mass spectrometry
- Patent number 7,504,620
- Issue date Mar 17, 2009
- Jeol Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser irradiation mass spectrometer
- Patent number 7,501,620
- Issue date Mar 10, 2009
- Shimadzu Corporation
- Kiyoshi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer
- Patent number 7,227,131
- Issue date Jun 5, 2007
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,211,792
- Issue date May 1, 2007
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer
- Patent number 7,148,473
- Issue date Dec 12, 2006
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining mass-to-charge ratio of ions and mass spectro...
- Patent number 7,091,480
- Issue date Aug 15, 2006
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,038,198
- Issue date May 2, 2006
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of determining mass-to-charge ratio of...
- Patent number 6,949,738
- Issue date Sep 27, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD
- Publication number 20240310327
- Publication date Sep 19, 2024
- OSAKA UNIVERSITY
- Michisato TOYODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DROPLET PARTICLE, AND METHOD AND DEVICE FOR PRODUCING DROPLET PARTICLE
- Publication number 20210223147
- Publication date Jul 22, 2021
- KIMOTO ELECTRIC CO., LTD.
- Takashi KIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALKALI METAL INTRODUCTION APPARATUS AND ALKALI METAL INTRODUCTION M...
- Publication number 20120321433
- Publication date Dec 20, 2012
- OSAKA UNIVERSITY
- Michisato Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distance Measuring Apparatus, Distance Measuring Method, Distance M...
- Publication number 20120257219
- Publication date Oct 11, 2012
- MSI. Tokyo, Inc.
- Michisato TOYODA
- G01 - MEASURING TESTING
Information Patent Application
Ion Source, And Mass Spectroscope Provided With Same
- Publication number 20120025072
- Publication date Feb 2, 2012
- MSI. Tokyo, Inc.
- Michisato Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Time-of-Flight Mass Spectrometry
- Publication number 20110133073
- Publication date Jun 9, 2011
- JEOL Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Time-of-Flight Mass Spectrometry
- Publication number 20090212208
- Publication date Aug 27, 2009
- JEOL Ltd.
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20080197276
- Publication date Aug 21, 2008
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for time-of-flight mass spectrometry
- Publication number 20070194223
- Publication date Aug 23, 2007
- JEOL, LTD
- Takaya Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser irradiation mass spectrometer
- Publication number 20070045527
- Publication date Mar 1, 2007
- Shimadzu Corporation
- Kiyoshi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of flight mass spectrometer
- Publication number 20050194528
- Publication date Sep 8, 2005
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20050151076
- Publication date Jul 14, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer and method of determining mass-to-charge ratio of...
- Publication number 20050103992
- Publication date May 19, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20050077461
- Publication date Apr 14, 2005
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of determining mass-to-charge ratio of ions and mass spectro...
- Publication number 20050077462
- Publication date Apr 14, 2005
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time of flight mass spectrometer
- Publication number 20050045817
- Publication date Mar 3, 2005
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Michisato Toyoda

Person

Patents Grantslast 30 patents

Droplet particle, and method and device for producing droplet particle

Ion source, and mass spectroscope provided with same

Alkali metal introduction apparatus and alkali metal introduction m...

Cyclone separator type mass analyzing system

Distance measuring apparatus, distance measuring method, distance m...

Method and apparatus for time-of-flight mass spectrometry

Method and apparatus for time-of-flight mass spectrometry

Mass spectrometer

Method and apparatus for time-of-flight mass spectrometry

Laser irradiation mass spectrometer

Time of flight mass spectrometer

Mass spectrometer

Time of flight mass spectrometer

Method of determining mass-to-charge ratio of ions and mass spectro...

Mass spectrometer

Mass spectrometer and method of determining mass-to-charge ratio of...

Patents Applicationslast 30 patents

MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD

DROPLET PARTICLE, AND METHOD AND DEVICE FOR PRODUCING DROPLET PARTICLE

ALKALI METAL INTRODUCTION APPARATUS AND ALKALI METAL INTRODUCTION M...

Distance Measuring Apparatus, Distance Measuring Method, Distance M...

Ion Source, And Mass Spectroscope Provided With Same

Method and Apparatus for Time-of-Flight Mass Spectrometry

Method and Apparatus for Time-of-Flight Mass Spectrometry

MASS SPECTROMETER

Method and apparatus for time-of-flight mass spectrometry

Laser irradiation mass spectrometer

Time of flight mass spectrometer

Mass spectrometer

Mass spectrometer and method of determining mass-to-charge ratio of...

Mass spectrometer

Method of determining mass-to-charge ratio of ions and mass spectro...

Time of flight mass spectrometer