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Michiya Kusaka

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  • Osaka-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Apparatus and method for power cycle test
    • Patent number 9,453,872
    • Issue date Sep 27, 2016
    • ESPEC Corp.
    • Michiya Kusaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC socket module
    • Patent number 6,767,221
    • Issue date Jul 27, 2004
    • ESPEC Corp.
    • Hirotaka Jiten
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    APPARATUS AND METHOD FOR POWER CYCLE TEST
    • Publication number 20140021973
    • Publication date Jan 23, 2014
    • Michiya Kusaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC socket module
    • Publication number 20030153199
    • Publication date Aug 14, 2003
    • Hirotaka Jiten
    • G01 - MEASURING TESTING