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Michiyasu Itoh
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Iruma, JP
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last 30 patents
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Patent Grant
Charge-particle energy analyzer
Patent number
4,219,730
Issue date
Aug 26, 1980
Hitachi, Ltd.
Isao Ishikawa
G01 - MEASURING TESTING
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Patent Grant
Charged-particle analyzer
Patent number
4,135,088
Issue date
Jan 16, 1979
Hitachi, Ltd.
Isao Ishikawa
G01 - MEASURING TESTING