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Miei TAKAHAMA
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Chiba-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device with hall elements and magnetic flux concentrator
Patent number
10,504,957
Issue date
Dec 10, 2019
ABLIC Inc.
Matsuo Kishi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor and method of manufacturing the same
Patent number
10,429,453
Issue date
Oct 1, 2019
ABLIC INC.
Takaaki Hioka
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having hall elements formed in a semiconductor...
Patent number
10,290,677
Issue date
May 14, 2019
ABLIC Inc.
Matsuo Kishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic sensor and method of manufacturing the same
Patent number
10,062,836
Issue date
Aug 28, 2018
ABLIC INC.
Takaaki Hioka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Electroformed Part and Timepiece
Publication number
20200024710
Publication date
Jan 23, 2020
SEIKO INSTRUMENTS INC.
MATSUO KISHI
G04 - HOROLOGY
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20170271401
Publication date
Sep 21, 2017
SII Semiconductor Corporation
Matsuo KISHI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
Publication number
20170271575
Publication date
Sep 21, 2017
SII Semiconductor Corporation
Takaaki HIOKA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20170271400
Publication date
Sep 21, 2017
SII Semiconductor Corporation
Matsuo KISHI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
Publication number
20170269169
Publication date
Sep 21, 2017
SII Semiconductor Corporation
Takaaki HIOKA
G01 - MEASURING TESTING