Migaku Oda

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Hokkaido, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope probe and manufacturing method therefor,...
- Patent number 7,553,335
- Issue date Jun 30, 2009
- Japan Science and Technology Agency
- Satoshi Tanda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE PROBE AND MANUFACTURING METHOD THEREFOR,...
- Publication number 20070272855
- Publication date Nov 29, 2007
- Satoshi Tanda
- G01 - MEASURING TESTING