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Miguel Santana Jr.
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Austin, TX, US
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last 30 patents
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Patent Grant
Photon detection enhancement of superconducting hot-electron photod...
Patent number
6,828,809
Issue date
Dec 7, 2004
Advanced Micro Devices, Inc.
Michael R. Bruce
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit cooling device
Patent number
6,800,933
Issue date
Oct 5, 2004
Advanced Micro Devices, Inc.
Charles R. Mathews
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanotube tip for atomic force microscope
Patent number
6,780,664
Issue date
Aug 24, 2004
Advanced Micro Devices, Inc.
Rama R. Goruganthu
G01 - MEASURING TESTING
Information
Patent Grant
Position-selective and material-selective silicon etching to form m...
Patent number
6,507,044
Issue date
Jan 14, 2003
Advanced Micro Devices, Inc.
Miguel Santana
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Highly selective, highly uniform plasma etch process for spin-on glass
Patent number
5,549,786
Issue date
Aug 27, 1996
Advanced Micro Devices, Inc.
Stephen A. Jones
H01 - BASIC ELECTRIC ELEMENTS