Miho Egawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus
- Patent number 8,248,264
- Issue date Aug 21, 2012
- Azbil Corporation
- Tetsuya Shimakata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING APPARATUS
- Publication number 20100265085
- Publication date Oct 21, 2010
- Yamatake Corporation
- Tetsuya Shimakata
- G01 - MEASURING TESTING