Mihoko Kijima

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Tsukuba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of OPC model building, information-processing apparatus, and...
- Patent number 8,788,981
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring sample and measurement device
- Patent number 8,581,187
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING SAMPLE AND MEASUREMENT DEVICE
- Publication number 20110139982
- Publication date Jun 16, 2011
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- G01 - MEASURING TESTING
Information Patent Application
Method of OPC Model Building, Information-Processing Apparatus, and...
- Publication number 20080250380
- Publication date Oct 9, 2008
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY