Mihoko OHIRA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing semiconductor substrate and method of evalu...
- Patent number 7,479,204
- Issue date Jan 20, 2009
- Sumco Corporation
- Morimasa Miyazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE AND METHOD OF EVALU...
- Publication number 20070193686
- Publication date Aug 23, 2007
- SUMCO CORPORATION
- Morimasa MIYAZAKI
- G01 - MEASURING TESTING