TREA

Mika EBIHARA

Follow

Person

  • Chiba-shi, JP
People

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20180203078
    • Publication date Jul 19, 2018
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20180182955
    • Publication date Jun 28, 2018
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20180159025
    • Publication date Jun 7, 2018
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20170294577
    • Publication date Oct 12, 2017
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20170271401
    • Publication date Sep 21, 2017
    • SII Semiconductor Corporation
    • Matsuo KISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20170271575
    • Publication date Sep 21, 2017
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20170271400
    • Publication date Sep 21, 2017
    • SII Semiconductor Corporation
    • Matsuo KISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20170269169
    • Publication date Sep 21, 2017
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20160276577
    • Publication date Sep 22, 2016
    • SII Semiconductor Corporation
    • Mika EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20160254441
    • Publication date Sep 1, 2016
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20160245881
    • Publication date Aug 25, 2016
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    HALL ELEMENT
    • Publication number 20160209480
    • Publication date Jul 21, 2016
    • SEIKO INSTRUMENTS INC.
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    VERTICAL HALL ELEMENT
    • Publication number 20160146906
    • Publication date May 26, 2016
    • SEIKO INSTRUMENTS INC.
    • Satoshi SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor Device
    • Publication number 20110079847
    • Publication date Apr 7, 2011
    • Mika Ebihara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20090230470
    • Publication date Sep 17, 2009
    • Mika Ebihara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semidoncudtor device and method of manufacturing the same
    • Publication number 20090057830
    • Publication date Mar 5, 2009
    • Mika Ebihara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20070205466
    • Publication date Sep 6, 2007
    • Mika Ebihara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20050127517
    • Publication date Jun 16, 2005
    • Mika Ebihara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device and manufacturing method therefor
    • Publication number 20040169224
    • Publication date Sep 2, 2004
    • Mika Ebihara
    • H01 - BASIC ELECTRIC ELEMENTS