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Mika Nasu

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electric connection device
    • Patent number 11,249,109
    • Issue date Feb 15, 2022
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe
    • Patent number 11,204,370
    • Issue date Dec 21, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe and electric connecting apparatus
    • Patent number 11,022,627
    • Issue date Jun 1, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe card and contact inspection device
    • Patent number 10,775,411
    • Issue date Sep 15, 2020
    • KABUSHIKI KAISHA NIHON MICRONICS
    • Tetsuya Yoshioka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact inspection device having a probe head and rotation restrict...
    • Patent number 10,215,801
    • Issue date Feb 26, 2019
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe and contact inspection device
    • Patent number 10,024,908
    • Issue date Jul 17, 2018
    • Kabushiki Kaisha Nihon Micronics
    • Hiroyasu Ando
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical contactor and electrical connecting apparatus
    • Patent number 9,583,857
    • Issue date Feb 28, 2017
    • KABUSHIKI KAISHA MIHON MICRONICS
    • Mika Nasu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Plunger housing body
    • Patent number D770986
    • Issue date Nov 8, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Electric contact
    • Patent number D770985
    • Issue date Nov 8, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Plunger housing body
    • Patent number D766188
    • Issue date Sep 13, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Plunger housing body
    • Patent number D766187
    • Issue date Sep 13, 2016
    • KABUSHIKI KAISHA NIHON MICRONIC
    • Mika Nasu
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Electric contact
    • Patent number D765602
    • Issue date Sep 6, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Electrical contactor and contact method for the same
    • Patent number 9,435,854
    • Issue date Sep 6, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for manufacturing a probe
    • Patent number 9,164,130
    • Issue date Oct 20, 2015
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE AND PROBE CARD
    • Publication number 20240168056
    • Publication date May 23, 2024
    • Kabushiki Kaisha Nihon Micronics
    • Mika NASU
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRIC CONNECTION DEVICE
    • Publication number 20200300892
    • Publication date Sep 24, 2020
    • Kabushiki Kaisha Nihon Micronics
    • Mika NASU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE
    • Publication number 20200174038
    • Publication date Jun 4, 2020
    • Kabushiki Kaisha Nihon Micronics
    • Mika NASU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE AND ELECTRIC CONNECTING APPARATUS
    • Publication number 20200025797
    • Publication date Jan 23, 2020
    • Kabushiki Kaisha Nihon Micronics
    • Mika NASU
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD AND CONTACT INSPECTION DEVICE
    • Publication number 20180299489
    • Publication date Oct 18, 2018
    • KABUSHIKI KAISHA NIHON MICRONICS
    • Tetsuya YOSHIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE AND CONTACT INSPECTION DEVICE
    • Publication number 20160146885
    • Publication date May 26, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Hiroyasu ANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT INSPECTION DEVICE
    • Publication number 20160146884
    • Publication date May 26, 2016
    • Kabushiki Kaisha Nihon Micronics
    • Mika NASU
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONTACTOR AND ELECTRICAL CONNECTING APPARATUS
    • Publication number 20160118738
    • Publication date Apr 28, 2016
    • Kabushiki Kaisha Nihon Micronics
    • MIKA NASU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD FOR MANUFACTURING A PROBE
    • Publication number 20140110372
    • Publication date Apr 24, 2014
    • Kabushiki Kaisha Nihon Micronics
    • Mika Nasu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electrical Contactor and Contact Method for the Same
    • Publication number 20140009182
    • Publication date Jan 9, 2014
    • Kabushiki Kaisha Nihon Micronics
    • Mika NASU
    • G01 - MEASURING TESTING