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Mike Hassel Shearer
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Peabody, MA, US
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last 30 patents
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Patent Grant
TEM sample equipped with an identifying function, focused ion beam...
Patent number
7,095,024
Issue date
Aug 22, 2006
SII NanoTechnology Inc.
Tatsuya Adachi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
TEM sample equipped with an identifying function, focused ion beam...
Publication number
20040227082
Publication date
Nov 18, 2004
Tatsuya Adachi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL