Mike M. HUANG

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for detecting anomalies in a semiconductor proces...
- Patent number 12,203,828
- Issue date Jan 21, 2025
- Applied Materials, Inc.
- Ryan T. Downey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR DETECTING ANOMALIES IN A SEMICONDUCTOR PROCES...
- Publication number 20250123186
- Publication date Apr 17, 2025
- Applied Materials, Inc.
- Ryan T. DOWNEY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING ANOMALIES IN A SEMICONDUCTOR PROCES...
- Publication number 20220341821
- Publication date Oct 27, 2022
- Applied Materials, Inc.
- Ryan T. DOWNEY
- G01 - MEASURING TESTING