Mike Simpson

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer fabrication system providing measurement data screening
- Patent number 6,446,022
- Issue date Sep 3, 2002
- Advanced Micro Devices, Inc.
- Elfido Coss
- G05 - CONTROLLING REGULATING
Information Patent Grant
E10 reporting tool
- Patent number 5,740,429
- Issue date Apr 14, 1998
- Advanced Micro Devices, Inc.
- Qingsu Wang
- G06 - COMPUTING CALCULATING COUNTING