Mike Von den Hoff

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Muenchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Identifying nuisances and defects of interest in defects detected o...
- Patent number 10,699,926
- Issue date Jun 30, 2020
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Qualifying patterns, patterning processes, or patterning apparatus...
- Patent number 7,418,124
- Issue date Aug 26, 2008
- KLA-Tencor Technologies Corp.
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST...
- Publication number 20220196723
- Publication date Jun 23, 2022
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Identifying Nuisances and Defects of Interest in Defects Detected o...
- Publication number 20190067060
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Qualifying patterns, patterning processes, or patterning apparatus...
- Publication number 20040091142
- Publication date May 13, 2004
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY