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Mike Whelan
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Coppell, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multimode configurable spectrometer
Patent number
11,424,115
Issue date
Aug 23, 2022
Verity Instruments, Inc.
Larry Arlos Bullock
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for calibration of optical signals in semiconduct...
Patent number
10,365,212
Issue date
Jul 30, 2019
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam exciter for use in chemical analysis in processing sy...
Patent number
9,997,325
Issue date
Jun 12, 2018
Verity Instruments, Inc.
Jimmy W. Hosch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High dynamic range measurement system for process monitoring
Patent number
9,801,265
Issue date
Oct 24, 2017
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Grant
Workpiece characterization system
Patent number
9,383,323
Issue date
Jul 5, 2016
Verity Instruments, Inc.
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Grant
High dynamic range measurement system for process monitoring
Patent number
9,310,250
Issue date
Apr 12, 2016
Verity Instruments, Inc.
Larry Arlos Bullock
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Calibration of a radiometric optical monitoring system used for fau...
Patent number
8,125,633
Issue date
Feb 28, 2012
Verity Instruments, Inc.
Mike Whelan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for characterization of microelectronic feature quality
Patent number
6,642,063
Issue date
Nov 4, 2003
Lam Research Corporation
Randall S. Mundt
G01 - MEASURING TESTING
Information
Patent Grant
Method for characterization of microelectronic feature quality
Patent number
6,432,729
Issue date
Aug 13, 2002
Lam Research Corporation
Randall S. Mundt
G01 - MEASURING TESTING
Information
Patent Grant
Dual frequency power supply and transducer
Patent number
5,816,476
Issue date
Oct 6, 1998
Verity Instruments Inc.
David Buice
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Power supply
Patent number
5,595,330
Issue date
Jan 21, 1997
Verity Instruments, Inc.
David Buice
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Ultrasonic transducer and mount
Patent number
5,364,005
Issue date
Nov 15, 1994
Verity Instruments Inc.
Paul Whelan
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR FAULT DETECTION AND OPERATIONAL READINESS FOR...
Publication number
20240019305
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
FIBEROPTICAL CABLE ASSEMBLIES AND INTERFACES FOR SPECTROMETERS
Publication number
20230280560
Publication date
Sep 7, 2023
Verity Instruments, Inc.
Larry Bullock
G02 - OPTICS
Information
Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
Publication number
20220406586
Publication date
Dec 22, 2022
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
Publication number
20180286650
Publication date
Oct 4, 2018
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATION OF OPTICAL SIGNALS IN SEMICONDUCT...
Publication number
20180136118
Publication date
May 17, 2018
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
HIGH DYNAMIC RANGE MEASUREMENT SYSTEM FOR PROCESS MONITORING
Publication number
20160316546
Publication date
Oct 27, 2016
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Application
Workpiece Characterization System
Publication number
20120120387
Publication date
May 17, 2012
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Application
Workpiece Characterization System
Publication number
20120025097
Publication date
Feb 2, 2012
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Application
Electron beam exciter for use in chemical analysis in processing sy...
Publication number
20100032587
Publication date
Feb 11, 2010
Jimmy W. Hosch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Calibration of a radiometric optical monitoring system used for fau...
Publication number
20090103081
Publication date
Apr 23, 2009
Verity Instruments, Inc.
Mike Whelan
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for characterization of microelectronic feature quality
Publication number
20030020917
Publication date
Jan 30, 2003
Randall S. Mundt
G01 - MEASURING TESTING