Mikhail Belousov

Person

Plainsboro, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Chemical vapor deposition flow inlet elements and methods
- Patent number 10,017,876
- Issue date Jul 10, 2018
- Veeco Instruments Inc.
- Mikhail Belousov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Temperature control for GaN based materials
- Patent number 9,677,944
- Issue date Jun 13, 2017
- Veeco Instruments Inc.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Grant
Processing methods and apparatus with temperature distribution control
- Patent number 9,324,590
- Issue date Apr 26, 2016
- Veeco Instruments Inc.
- Alex Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Temperature control for GaN based materials
- Patent number 9,200,965
- Issue date Dec 1, 2015
- Veeco Instruments Inc.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Grant
Chemical vapor deposition with elevated temperature gas injection
- Patent number 9,053,935
- Issue date Jun 9, 2015
- Veeco Instruments Inc.
- Alexander I. Gurary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical vapor deposition with elevated temperature gas injection
- Patent number 8,937,000
- Issue date Jan 20, 2015
- Veeco Instruments Inc.
- Alex Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Chemical vapor deposition with elevated temperature gas injection
- Patent number 8,895,107
- Issue date Nov 25, 2014
- Veeco Instruments Inc.
- Alex Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Chemical vapor deposition flow inlet elements and methods
- Patent number 8,636,847
- Issue date Jan 28, 2014
- Veeco Instruments Inc.
- Mikhail Belousov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for batch non-contact material characterization
- Patent number 8,441,653
- Issue date May 14, 2013
- Veeco Instruments Inc.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Chemical vapor deposition flow inlet elements and methods
- Patent number 8,303,713
- Issue date Nov 6, 2012
- Veeco Instruments Inc.
- Mikhail Belousov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for batch non-contact material characterization
- Patent number 8,198,605
- Issue date Jun 12, 2012
- Veeco Instruments Inc.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for batch non-contact material characterization
- Patent number 8,022,372
- Issue date Sep 20, 2011
- Veeco Instruments Inc.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the curvature of reflective surf...
- Patent number 7,570,368
- Issue date Aug 4, 2009
- Veeco Instruments Inc.
- Mikhail Belousov
- G01 - MEASURING TESTING
Information Patent Grant
Calibration wafer and method of calibrating in situ temperatures
- Patent number 7,452,125
- Issue date Nov 18, 2008
- Veeco Instruments Inc.
- Boris Volf
- G01 - MEASURING TESTING
Information Patent Grant
Calibration wafer and method of calibrating in situ temperatures
- Patent number 7,275,861
- Issue date Oct 2, 2007
- Veeco Instruments Inc.
- Boris Volf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS
- Publication number 20180320289
- Publication date Nov 8, 2018
- VEECO INSTRUMENTS INC.
- Mikhail Belousov
- C30 - CRYSTAL GROWTH
Information Patent Application
PROCESSING METHODS AND APPARATUS WITH TEMPERATURE DISTRIBUTION CONTROL
- Publication number 20160204044
- Publication date Jul 14, 2016
- VEECO INSTRUMENTS INC.
- Alexander I. Gurary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL FOR GaN BASED MATERIALS
- Publication number 20160041037
- Publication date Feb 11, 2016
- VEECO INSTRUMENTS INC.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL VAPOR DEPOSITION WITH ELEVATED TEMPERATURE GAS INJECTION
- Publication number 20150056790
- Publication date Feb 26, 2015
- VEECO INSTRUMENTS INC.
- Alexander I. Gurary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL VAPOR DEPOSITION WITH ELEVATED TEMPERATURE GAS INJECTION
- Publication number 20140352619
- Publication date Dec 4, 2014
- Alexander I. Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS
- Publication number 20140116330
- Publication date May 1, 2014
- VEECO INSTRUMENTS INC.
- Mikhail Belousov
- C30 - CRYSTAL GROWTH
Information Patent Application
TEMPERATURE CONTROL FOR GaN BASED MATERIALS
- Publication number 20130343426
- Publication date Dec 26, 2013
- VEECO INSTRUMENTS INC.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS
- Publication number 20120325151
- Publication date Dec 27, 2012
- VEECO INSTRUMENTS INC.
- Mikhail Belousov
- C30 - CRYSTAL GROWTH
Information Patent Application
Apparatus and Method for Batch Non-Contact Material Characterization
- Publication number 20120248336
- Publication date Oct 4, 2012
- VEECO INSTRUMENTS INC.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL VAPOR DEPOSITION WITH ELEVATED TEMPERATURE GAS INJECTION
- Publication number 20120040514
- Publication date Feb 16, 2012
- VEECO INSTRUMENTS INC.
- Alex Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND METHOD FOR BATCH NON-CONTACT MATERIAL CHARACTERIZATION
- Publication number 20110300645
- Publication date Dec 8, 2011
- VEECO INSTRUMENTS INC.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR BATCH NON-CONTACT MATERIAL CHARACTERIZATION
- Publication number 20110297076
- Publication date Dec 8, 2011
- VEECO INSTRUMENTS INC.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHODS AND APPARATUS WITH TEMPERATURE DISTRIBUTION CONTROL
- Publication number 20110206843
- Publication date Aug 25, 2011
- VEECO INSTRUMENTS INC.
- Alex Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS
- Publication number 20100143588
- Publication date Jun 10, 2010
- VEECO INSTRUMENTS INC.
- Mikhail Belousov
- C30 - CRYSTAL GROWTH
Information Patent Application
Chemical vapor deposition with elevated temperature gas injection
- Publication number 20100112216
- Publication date May 6, 2010
- Veeco Instruments Inc.
- Alex Gurary
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus and Method for Batch Non-Contact Material Characterization
- Publication number 20090224175
- Publication date Sep 10, 2009
- VEECO INSTRUMENTS INC.
- Dong Seung Lee
- G01 - MEASURING TESTING
Information Patent Application
Calibration wafer and method of calibrating in situ temperatures
- Publication number 20070291816
- Publication date Dec 20, 2007
- Veeco Instruments Inc.
- Boris Volf
- G01 - MEASURING TESTING
Information Patent Application
Calibration wafer and method of calibrating in situ temperatures
- Publication number 20060171442
- Publication date Aug 3, 2006
- Veeco Instruments Inc.
- Boris Volf
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring the curvature of reflective surf...
- Publication number 20050286058
- Publication date Dec 29, 2005
- Veeco Instruments Inc.
- Mikhail Belousov
- G01 - MEASURING TESTING

Mikhail Belousov

Person

Patents Grantslast 30 patents

Chemical vapor deposition flow inlet elements and methods

Temperature control for GaN based materials

Processing methods and apparatus with temperature distribution control

Temperature control for GaN based materials

Chemical vapor deposition with elevated temperature gas injection

Chemical vapor deposition with elevated temperature gas injection

Chemical vapor deposition with elevated temperature gas injection

Chemical vapor deposition flow inlet elements and methods

Apparatus and method for batch non-contact material characterization

Chemical vapor deposition flow inlet elements and methods

Apparatus and method for batch non-contact material characterization

Apparatus and method for batch non-contact material characterization

Method and apparatus for measuring the curvature of reflective surf...

Calibration wafer and method of calibrating in situ temperatures

Calibration wafer and method of calibrating in situ temperatures

Patents Applicationslast 30 patents

CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS

PROCESSING METHODS AND APPARATUS WITH TEMPERATURE DISTRIBUTION CONTROL

TEMPERATURE CONTROL FOR GaN BASED MATERIALS

CHEMICAL VAPOR DEPOSITION WITH ELEVATED TEMPERATURE GAS INJECTION

CHEMICAL VAPOR DEPOSITION WITH ELEVATED TEMPERATURE GAS INJECTION

CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS

TEMPERATURE CONTROL FOR GaN BASED MATERIALS

CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS

Apparatus and Method for Batch Non-Contact Material Characterization

CHEMICAL VAPOR DEPOSITION WITH ELEVATED TEMPERATURE GAS INJECTION

APPARATUS AND METHOD FOR BATCH NON-CONTACT MATERIAL CHARACTERIZATION

APPARATUS AND METHOD FOR BATCH NON-CONTACT MATERIAL CHARACTERIZATION

PROCESSING METHODS AND APPARATUS WITH TEMPERATURE DISTRIBUTION CONTROL

CHEMICAL VAPOR DEPOSITION FLOW INLET ELEMENTS AND METHODS

Chemical vapor deposition with elevated temperature gas injection

Apparatus and Method for Batch Non-Contact Material Characterization

Calibration wafer and method of calibrating in situ temperatures

Calibration wafer and method of calibrating in situ temperatures

Method and apparatus for measuring the curvature of reflective surf...