Mikhail Sluch

Follow

Person

Redmond, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical metrology system for spectral imaging of a sample
- Patent number 9,846,122
- Issue date Dec 19, 2017
- Nanometrics Incorporated
- Andrzej Buczkowski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20160290927
- Publication date Oct 6, 2016
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING