Mikhail Sushchik

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement methodology of advanced nanostructures
- Patent number 11,156,548
- Issue date Oct 26, 2021
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multi-dimensional model of optical dispersion
- Patent number 11,060,982
- Issue date Jul 13, 2021
- KLA Corporation
- Natalia Malkova
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system calibration refinement
- Patent number 10,605,722
- Issue date Mar 31, 2020
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer film metrology using an effective media approximation
- Patent number 10,429,296
- Issue date Oct 1, 2019
- KLA-Tencor Corporation
- Mark A. Neil
- G02 - OPTICS
Information Patent Grant
Metrology system calibration refinement
- Patent number 9,857,291
- Issue date Jan 2, 2018
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for optimized scatterometry
- Patent number 9,127,927
- Issue date Sep 8, 2015
- KLA-Tencor Corporation
- Jonathan Iloreta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
Multi-Dimensional Model Of Optical Dispersion
- Publication number 20200292467
- Publication date Sep 17, 2020
- KLA Corporation
- Natalia Malkova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Methodology of Advanced Nanostructures
- Publication number 20190178788
- Publication date Jun 13, 2019
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Application
Multilayer Film Metrology Using An Effective Media Approximation
- Publication number 20190033211
- Publication date Jan 31, 2019
- KLA-Tencor Corporation
- Mark A. Neil
- G02 - OPTICS
Information Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
- Publication number 20180100796
- Publication date Apr 12, 2018
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
- Publication number 20140340682
- Publication date Nov 20, 2014
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR OPTIMIZED SCATTEROMETRY
- Publication number 20130158948
- Publication date Jun 20, 2013
- Jonathan Iloreta
- G01 - MEASURING TESTING