Mikhail Yavor

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Saint-Petersbourg, RU

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Patents Grantslast 30 patents

Information Patent Grant
Mass analysis device with wide angular acceptance including a refle...
- Patent number 8,502,139
- Issue date Aug 6, 2013
- Cameca
- Mikhail Yavor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution wide angle tomographic probe
- Patent number 8,074,292
- Issue date Dec 6, 2011
- Cameca
- Alain Bostel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS ANALYSIS DEVICE WITH WIDE ANGULAR ACCEPTANCE INCLUDING A REFLE...
- Publication number 20110303841
- Publication date Dec 15, 2011
- CAMECA
- Mikhail Yavor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Resolution Wide Angle Tomographic Probe
- Publication number 20100223698
- Publication date Sep 2, 2010
- CAMECA
- Alain Bostel
- H01 - BASIC ELECTRIC ELEMENTS