Miki HIRABAYASHI

Follow

Person

Chofu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Abnormality diagnostic device, abnormality diagnostic method, and p...
- Patent number 11,692,910
- Issue date Jul 4, 2023
- JAPAN AEROSPACE EXPLORATION AGENCY
- Kaname Kawatsu
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detection device, abnormality detection method, and pro...
- Patent number 11,669,080
- Issue date Jun 6, 2023
- JAPAN AEROSPACE EXPLORATION AGENCY
- Seiji Tsutsumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND PRO...
- Publication number 20210397175
- Publication date Dec 23, 2021
- JAPAN AEROSPACE EXPLORATION AGENCY
- Seiji TSUTSUMI
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DIAGNOSTIC DEVICE, ABNORMALITY DIAGNOSTIC METHOD, AND P...
- Publication number 20210348985
- Publication date Nov 11, 2021
- JAPAN AEROSPACE EXPLORATION AGENCY
- Kaname KAWATSU
- G01 - MEASURING TESTING