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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Pattern evaluation device
Patent number
10,854,420
Issue date
Dec 1, 2020
HITACHI HIGH-TECH CORPORATION
Miki Isawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processor, method for generating pattern using self-organizin...
Patent number
10,732,512
Issue date
Aug 4, 2020
HITACHI HIGH-TECH CORPORATION
Takumichi Sutani
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Pattern measurement device, and computer program for measuring pattern
Patent number
10,545,018
Issue date
Jan 28, 2020
Hitachi High-Technologies Corporation
Satoru Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for pattern measurement, method for setting device parameter...
Patent number
9,831,062
Issue date
Nov 28, 2017
Hitachi High-Technologies Corporation
Makoto Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern measurement device and computer program for evaluating patt...
Patent number
9,804,107
Issue date
Oct 31, 2017
Hitachi High-Technologies Corporation
Akiyuki Sugiyama
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Charged particle beam device
Patent number
9,627,171
Issue date
Apr 18, 2017
Hitachi High-Technologies Corporation
Hiroshi Makino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern measurement device, evaluation method of polymer compounds...
Patent number
9,589,343
Issue date
Mar 7, 2017
Hitachi High-Technologies Corporation
Miki Isawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
9,502,212
Issue date
Nov 22, 2016
Hitachi High-Technologies Corporation
Yuzuru Mizuhara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
9,472,376
Issue date
Oct 18, 2016
Hitachi High-Technologies Corporation
Toshiyuki Yokosuka
G01 - MEASURING TESTING
Information
Patent Grant
Pattern measuring apparatus and computer program
Patent number
9,000,365
Issue date
Apr 7, 2015
Hitachi High-Technologies Corporation
Yuzuru Mochizuki
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
8,648,300
Issue date
Feb 11, 2014
Hitachi High-Technologies Corporation
Miki Isawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PATTERN EVALUATION DEVICE
Publication number
20200098543
Publication date
Mar 26, 2020
Miki ISAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Image Processor, Method for Generating Pattern Using Self-Organizin...
Publication number
20180181009
Publication date
Jun 28, 2018
Hitachi High-Technologies Corporation
Takumichi SUTANI
B82 - NANO-TECHNOLOGY
Information
Patent Application
Pattern Measurement Device, and Computer Program for Measuring Pattern
Publication number
20160320182
Publication date
Nov 3, 2016
Hitachi High-Technologies Corporation
Satoru YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Pattern Measurement Device and Computer Program
Publication number
20160313266
Publication date
Oct 27, 2016
Hitachi High-Technologies Corporation
Akiyuki SUGIYAMA
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20150357153
Publication date
Dec 10, 2015
Hitachi High-Technologies Corporation
Hiroshi MAKINO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Pattern Measurement, Method for Setting Device Parameter...
Publication number
20150357158
Publication date
Dec 10, 2015
Hitachi High-Technologies Corporation
Makoto SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20150348748
Publication date
Dec 3, 2015
Hitachi High-Technologies Corporation
Yuzuru MIZUHARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGE PROCESSOR, METHOD FOR GENERATING PATTERN USING SELF- ORGANIZI...
Publication number
20150277237
Publication date
Oct 1, 2015
Hitachi High-Technologies Corporation
Takumichi Sutani
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Pattern Measurement Device, Evaluation Method of Polymer Compounds...
Publication number
20150243008
Publication date
Aug 27, 2015
Hitachi High-Technologies Corporation
Miki Isawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SCANNING ELECTRON MICROSCOPE
Publication number
20150008322
Publication date
Jan 8, 2015
Hitachi High-Technologies Corporation
Toshiyuki Yokosuka
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20140014836
Publication date
Jan 16, 2014
Hitachi High-Technologies Corporation
Miki ISAWA
G01 - MEASURING TESTING
Information
Patent Application
PATTERN MEASURING APPARATUS AND COMPUTER PROGRAM
Publication number
20120037801
Publication date
Feb 16, 2012
Yuzuru Mochizuki
G01 - MEASURING TESTING